BURN-IN BOARDS (BiBs) is a common term for boards specifically designed and used to test reliability of known good semiconductor devices at elevated temperature up to 150 °C.
BURN-IN BOARDS (BiBs) is a common term for boards specifically designed and used to test reliability of known good semiconductor devices at elevated temperature up to 150 °C.
| BURNT : substrate & copper trace | |
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| TOP side : Before repair | TOP side : After repair |
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| BOTTOM side : Before repair | BOTTOM side : After repair |
| BURNT : substrate & copper trace | |
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